Influence of waveguide width errors on TRL and LRL calibrations
Paper in proceeding, 2012
This paper investigates the impact of the waveguide width tolerance in TE10 mode waveguide TRL/LRL calibration kits. This is important for vector network analyzer measurements in the THZ range where waveguide tolerances become large compared the wavelength and to cross sectional dimensions. Besides causing reflections in the waveguide interface, the waveguide width tolerance also causes a change in the propagation constant that can shift the reference planes and cause problems in estimating the propagation constant of the Line standard. We conclude that the tolerances may cause a significant uncertainty contribution and may limit the useful band of the calibration kit.
waveguide
LRL
VNA
S-parameters
TRL
calibration
uncertainty
Author
Jörgen Stenarson
GigaHertz Centre
Klas Yhland
GigaHertz Centre
Thi Ngoc Do Thanh
GigaHertz Centre
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Huan Zhao Ternehäll
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
GigaHertz Centre
Peter Sobis
GigaHertz Centre
Jan Stake
GigaHertz Centre
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
79th Automatic RF Techniques Microwave Measurement Conference (ARFTG)
6291182
978-1-4673-1230-1 (ISBN)
Areas of Advance
Information and Communication Technology
Subject Categories
Control Engineering
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/ARFTG79.2012.6291182
ISBN
978-1-4673-1230-1