Influence of waveguide width errors on TRL and LRL calibrations
Paper i proceeding, 2012

This paper investigates the impact of the waveguide width tolerance in TE10 mode waveguide TRL/LRL calibration kits. This is important for vector network analyzer measurements in the THZ range where waveguide tolerances become large compared the wavelength and to cross sectional dimensions. Besides causing reflections in the waveguide interface, the waveguide width tolerance also causes a change in the propagation constant that can shift the reference planes and cause problems in estimating the propagation constant of the Line standard. We conclude that the tolerances may cause a significant uncertainty contribution and may limit the useful band of the calibration kit.

waveguide

LRL

VNA

S-parameters

TRL

calibration

uncertainty

Författare

Jörgen Stenarson

GigaHertz Centrum

Klas Yhland

GigaHertz Centrum

Thi Ngoc Do Thanh

GigaHertz Centrum

Chalmers, Mikroteknologi och nanovetenskap (MC2), Terahertz- och millimetervågsteknik

Huan Zhao Ternehäll

Chalmers, Mikroteknologi och nanovetenskap (MC2), Terahertz- och millimetervågsteknik

GigaHertz Centrum

Peter Sobis

GigaHertz Centrum

Jan Stake

GigaHertz Centrum

Chalmers, Mikroteknologi och nanovetenskap (MC2), Terahertz- och millimetervågsteknik

79th Automatic RF Techniques Microwave Measurement Conference (ARFTG)

6291182

Styrkeområden

Informations- och kommunikationsteknik

Ämneskategorier

Reglerteknik

Annan elektroteknik och elektronik

DOI

10.1109/ARFTG79.2012.6291182

ISBN

978-1-4673-1230-1