OTA Testing in Multipath of Antennas and Wireless Devices With MIMO and OFDM
Paper in proceeding, 2012

New over-the-air (OTA) measurement technology is wanted for quantitative testing of modern wireless devices for use in multipath. We show that the reverberation chamber emulates a rich isotropic multipath (RIMP), making it an extreme reference environment for testing of wireless devices. This thereby complements testing in anechoic chambers representing the opposite extreme reference environment: pure line-of-sight (LOS). Antenna diversity gain was defined for RIMP environments based on improved fading performance. This paper finds this RIMP-diversity gain also valid as a metric of the cumulative improvement of the 1% worst users randomly distributed in the RIMP environment. The paper argues that LOS in modern wireless systems is random due to randomness of the orientations of the users and their devices. This leads to the definition of cumulative LOS-diversity gain of the 1% worst users in random LOS. This is generally not equal to the RIMP-diversity gain. The paper overviews the research on reverberation chambers for testing of wireless devices in RIMP environments. Finally, it presents a simple theory that can accurately model measured throughput for a long-term evolution (LTE) system with orthogonal frequency-division multiplexing (OFDM) and multiple-input-multiple-output (MIMO), the effects of which can clearly be seen and depend on the controllable time delay spread in the chamber.

diversity gain



over-the-air (OTA) measurements

Rayleigh fading

radiation efficiency

reverberation chamber

error rate measurements


multiple-input-multiple-output (MIMO)


Antenna measurements




Per-Simon Kildal

Chalmers, Signals and Systems, Communication, Antennas and Optical Networks

Charlie Orlenius

Chalmers, Signals and Systems, Communication, Antennas and Optical Networks

Jan Carlsson

Chalmers, Signals and Systems, Communication, Antennas and Optical Networks

Proceedings of the IEEE

0018-9219 (ISSN)

Vol. 100 7 2145-2157 6202668

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering



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