Inhomogeneous Microstructure and Electrical Transport Properties at the LaAlO3/SrTiO3 Interface

Alexei Kalaboukhov; Tord Claeson; Pier Paolo Aurino; Robert Gunnarsson; Dag Winkler; Eva Olsson; Nikolina Tuzla; Johan Börjesson; Yu Cao; Lars Nyborg; Y. A. Boikov; I.T. Serenkov; V.I. Sakharov; M. P. Volkov

doi:10.1143/JJAP.51.11PG10

Inhomogeneous Microstructure and Electrical Transport Properties at the LaAlO3/SrTiO3 Interface
Journal article, 2012

Medium-energy ion spectroscopy (MEIS), scanning transmission electron microscopy (STEM) and X-ray photoemission spectroscopy (XPS) were used to investigate the composition and microstructure of LaAlO3/SrTiO3 (LAO/STO) interfaces grown by pulsed laser deposition of LAO on TiO2-terminated STO substrates under different oxidizing conditions. MEIS and XPS indicated Sr/La and Al/Ti intermixing within several atomic layers at all studied interfaces. XPS and STEM revealed that La diffuses deeper than Al. Analysis of the MEIS data suggests inhomogeneous lateral distribution of the diffused elements. This is further supported by the observation of a large positive magneto-resistance at low temperatures. We discuss the role of lateral inhomogeneities on the formation of the electron gas at the LAO/STO interface.

growth

room-temperature

heterointerface

oxide heterostructures