On the Mechanism of MoSi2 Pesting in the Temperature Range 400–500°C
Journal article, 2000
pest layer
peak pesting temperature
thermogravimetric analysis
scanning electron microscope
low temperature oxidation
Author
Kristina Hansson
Chalmers, Department of Environmental Inorganic Chemistry
Mats Halvarsson
Chalmers, Department of Experimental Physics, Microscopy and Microanalysis
Jun Eu Tang
Chalmers, Department of Experimental Physics, Microscopy and Microanalysis
Jan-Erik Svensson
Chalmers, Department of Environmental Inorganic Chemistry
Mats Sundberg
Robert Pompe
Ceramic Engineering and Science Proceedings
0196-6219 (ISSN) 1940-6339 (eISSN)
Vol. 21 4 469-476Subject Categories
Inorganic Chemistry
Materials Chemistry
Driving Forces
Sustainable development
Areas of Advance
Energy
Materials Science
Roots
Basic sciences