A near-field scanning microwave microscope based on a superconducting resonator for low power measurements
Journal article, 2013
superconducting resonators
atomic force microscopy
near-field scanning optical microscopy
microwave resonators
quantum optics
Author
Sebastian Erik de Graaf
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Andrey Danilov
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Astghik Adamyan
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Sergey Kubatkin
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Review of Scientific Instruments
0034-6748 (ISSN) 1089-7623 (eISSN)
Vol. 84 2 023706- 023706Areas of Advance
Nanoscience and Nanotechnology
Subject Categories
Nano Technology
Condensed Matter Physics
Infrastructure
Nanofabrication Laboratory
DOI
10.1063/1.4792381