Oxide Degradation Of Wafer Bonded Metal-Oxide Semiconductor Capacitors Following Fowler-Nordheim Electron Injection
Journal article, 1992

Author

Stefan Bengtsson

Department of Solid State Electronics

Other publications Research

Anders Jauhiainen

Department of Solid State Electronics

Olof Engström

Department of Solid State Electronics

Other publications Research

Journal Of The Electrochemical Society

Vol. 139 8 2302-2306

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

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Created

10/8/2017

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