Charge Trapping In Wafer Bonded Mos Structures
Journal article, 1992

Author

Anders Jauhiainen

Department of Solid State Electronics

Stefan Bengtsson

Department of Solid State Electronics

Olof Engström

Department of Solid State Electronics

Microelectronic Engineering

Vol. 19 1-4 597-600

Subject Categories (SSIF 2011)

Other Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/8/2017