Single Flange 2-port Design For THz Integrated Circuit S-parameter Characterization
Paper in proceeding, 2013
A single flange 2-port TRL calibration and measurement setup for accurate THz S-parameter characterization of integrated membrane circuit devices is proposed. The proposed setup facilitates shorter access waveguides, which greatly improves the calibration uncertainty.
membrane
THz
waveguide
2-port
J-band
integrated
calibration
uncertainty
S-parameters
WR-03
TRL
Author
Johanna Hanning
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
GigaHertz Centre
Jörgen Stenarson
GigaHertz Centre
Klas Yhland
GigaHertz Centre
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Peter Sobis
GigaHertz Centre
Tomas Bryllert
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Jan Stake
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
GigaHertz Centre
International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
21622027 (ISSN) 21622035 (eISSN)
1-2Areas of Advance
Information and Communication Technology
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/IRMMW-THz.2013.6665800