Experiment design for quick statistical FET large signal model extraction
Paper in proceedings, 2013

Process variations influence the accuracy of designs and yield in production. This paper addresses the implementation of these variations in large signal FET models, with particular attention on the organization of measurements as to speed up the direct extraction of the model parameters. © 2013 IEEE.

Statistical Models

FET

Large Signal Models

Author

Iltcho Angelov

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Mattias Ferndahl

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Marcus Gavell

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

G. Avolio

KU Leuven

D. Schreurs

KU Leuven

81st ARFTG Microwave Measurement Conference: Metrology for High Speed Circuits and Systems, ARFTG 2013

6579041

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/ARFTG.2013.6579041

ISBN

9781467349826

More information

Latest update

5/29/2018