Experiment design for quick statistical FET large signal model extraction
Paper in proceeding, 2013
Statistical Models
FET
Large Signal Models
Author
Iltcho Angelov
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Mattias Ferndahl
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Marcus Gavell
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
G. Avolio
KU Leuven
D. Schreurs
KU Leuven
81st ARFTG Microwave Measurement Conference: Metrology for High Speed Circuits and Systems, ARFTG 2013
6579041
9781467349826 (ISBN)
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/ARFTG.2013.6579041
ISBN
9781467349826