Preparation of TEM specimens from fragile oxide films using focused ion beam (FIB)
Journal article, 2002
Author
Johan Angenete
Chalmers, Department of Experimental Physics, Microscopy and Microanalysis
Krystyna Marta Stiller
Chalmers, Department of Experimental Physics, Microscopy and Microanalysis
Henrik Svensson
Chalmers, Department of Experimental Physics, Microscopy and Microanalysis
15th International Congress on Electron Microscopy (ICEM-15)
Subject Categories
Materials Engineering