Analysis of WC with increased Ta doping
Journal article, 2015
APT
EBSD
SEM
Scanning electron microscopy
XRD
Author
Jonathan Weidow
Chalmers, Applied Physics, Materials Microstructure
E. Halwax
Vienna University of Technology
W. D. Schubert
Vienna University of Technology
International Journal of Refractory Metals and Hard Materials
02634368 (ISSN) 22133917 (eISSN)
Vol. 51 56-60Subject Categories
Metallurgy and Metallic Materials
DOI
10.1016/j.ijrmhm.2015.03.001