Thickness measurement of small particles in TEM with EELS, CBED and EFTEM
Paper in proceedings, 2002

Author

Yiming Yao

Chalmers, Department of Experimental Physics, Microscopy and Microanalysis

Anders Thölén

Chalmers, Department of Experimental Physics, Microscopy and Microanalysis

Proceedings of ICEM-15 Durban 2002, 15th International Congress of Electron Microscopy, Durban South Africa, 1-6 September 2002

469-470

Subject Categories

Other Materials Engineering

Areas of Advance

Materials Science

More information

Created

10/7/2017