Thickness measurement of small particles in TEM with EELS, CBED and EFTEM
Paper in proceeding, 2002
Author
Yiming Yao
Chalmers, Department of Experimental Physics, Microscopy and Microanalysis
Anders Thölén
Chalmers, Department of Experimental Physics, Microscopy and Microanalysis
Proceedings of ICEM-15 Durban 2002, 15th International Congress of Electron Microscopy, Durban South Africa, 1-6 September 2002
469-470
Subject Categories
Other Materials Engineering
Areas of Advance
Materials Science