New method for determination of the peak-velocity in epitaxial semiconductor structures by dc measurements on microbridges
Journal article, 1991

A simple current-voltage measurement technique using microbridge patterns is described as a fast method for the determination of the effective peak electron velocity in III-V semiconducting materials. The method is tested for GaAs samples. Microbridge patterns with different geometries were investigated and the influence of ''self-heating'' by power dissipation was examined. Some other potential sources of errors deteriorating the accuracy of measurements were determined.

Author

W. Strupinski

Herbert Zirath

Department of Microwave Technology

Hans Grönqvist

Department of Microwave Technology

Niklas Rorsman

Department of Microwave Technology

Applied Physics Letters

0003-6951 (ISSN) 1077-3118 (eISSN)

Vol. 59 24 3151-3153

Areas of Advance

Information and Communication Technology

Nanoscience and Nanotechnology (2010-2017)

Materials Science

Subject Categories

Physical Sciences

Electrical Engineering, Electronic Engineering, Information Engineering

Other Electrical Engineering, Electronic Engineering, Information Engineering

Condensed Matter Physics

DOI

10.1063/1.105768

More information

Created

10/7/2017