New method for determination of the peak-velocity in epitaxial semiconductor structures by dc measurements on microbridges
Artikel i vetenskaplig tidskrift, 1991

A simple current-voltage measurement technique using microbridge patterns is described as a fast method for the determination of the effective peak electron velocity in III-V semiconducting materials. The method is tested for GaAs samples. Microbridge patterns with different geometries were investigated and the influence of ''self-heating'' by power dissipation was examined. Some other potential sources of errors deteriorating the accuracy of measurements were determined.

Författare

W. Strupinski

Herbert Zirath

Institutionen för mikrovågsteknik

Hans Grönqvist

Institutionen för mikrovågsteknik

Niklas Rorsman

Institutionen för mikrovågsteknik

Applied Physics Letters

0003-6951 (ISSN) 1077-3118 (eISSN)

Vol. 59 24 3151-3153

Styrkeområden

Informations- och kommunikationsteknik

Nanovetenskap och nanoteknik

Materialvetenskap

Ämneskategorier

Fysik

Elektroteknik och elektronik

Annan elektroteknik och elektronik

Den kondenserade materiens fysik

DOI

10.1063/1.105768

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Skapat

2017-10-07