Linear and nonlinear characterization of low-stress high-confinement silicon-rich nitride waveguides: erratum
Magazine article, 2017
We correct the value for the nonlinear Kerr effect of the silicon-rich nitride waveguide presented in Opt. Express 23, 25828 (2015).
Author
Clemens Krückel
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Attila Fülöp
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Thomas Klintberg
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Jörgen Bengtsson
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Peter Andrekson
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Victor Torres Company
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Optics Express
1094-4087 (ISSN) 10944087 (eISSN)
Vol. 25 7 7443-7444Areas of Advance
Information and Communication Technology
Nanoscience and Nanotechnology
Materials Science
Subject Categories
Communication Systems
Nano Technology
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1364/OE.25.007443