Linear and nonlinear characterization of low-stress high-confinement silicon-rich nitride waveguides: erratum
Magazine article, 2017

We correct the value for the nonlinear Kerr effect of the silicon-rich nitride waveguide presented in Opt. Express 23, 25828 (2015).

Author

Clemens Krückel

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Attila Fülöp

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Thomas Klintberg

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Jörgen Bengtsson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Peter Andrekson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Victor Torres Company

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Optics Express

1094-4087 (ISSN)

Vol. 25 7 7443-7444

Areas of Advance

Information and Communication Technology

Nanoscience and Nanotechnology (2010-2017)

Materials Science

Subject Categories

Communication Systems

Nano Technology

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1364/OE.25.007443

More information

Created

10/7/2017