Interfaces in Oxides Formed on NiAlCr Doped with Y, Hf, Ti, and B
Journal article, 2017
atom probe tomography
grain boundaries
diffusion
reactive elements
oxidation
Author
Torben Boll
Chalmers, Physics, Materials Microstructure
K.A. Unocic
Oak Ridge National Laboratory
B.A. Pint
Oak Ridge National Laboratory
Krystyna Marta Stiller
Chalmers, Physics, Materials Microstructure
Microscopy and Microanalysis
1431-9276 (ISSN) 1435-8115 (eISSN)
Vol. 23 2 396-403Subject Categories
Materials Engineering
Physical Sciences
DOI
10.1017/S1431927617000186