Room temperature plasticity in thermally grown sub-micron oxide scales revealed by micro-cantilever bending
Journal article, 2018
Crystalline oxides
Plastic deformation
Focused ion beam (FIB)
Scanning electron microscopy (SEM)
Micro-mechanical testing
Author
Anand Harihara Subramonia Iyer
Chalmers, Physics, Materials Microstructure
Krystyna Marta Stiller
Chalmers, Physics, Materials Microstructure
Magnus Hörnqvist Colliander
Chalmers, Physics, Materials Microstructure
Scripta Materialia
1359-6462 (ISSN)
Vol. 144 9-12Subject Categories
Materials Engineering
Other Engineering and Technologies
Metallurgy and Metallic Materials
Infrastructure
Chalmers Materials Analysis Laboratory
Areas of Advance
Materials Science
DOI
10.1016/j.scriptamat.2017.09.036