Room temperature plasticity in thermally grown sub-micron oxide scales revealed by micro-cantilever bending
Artikel i vetenskaplig tidskrift, 2018

We propose a new geometry for focused ion beam milled micro-cantilevers, which allows production of residual stress-free, isolated thin film specimens from film-substrate systems. This geometry was used to demonstrate the presence of permanent deformation in about 200 nm thick thermally grown oxide scales on a Ni-base superalloy, after applying large bending displacements in-situ in a scanning electron microscope. Stiffness measurements performed before and after the bending tests confirmed the absence of micro-cracks, leading to the conclusion that plastic deformation occurred in the oxide scale. The proposed method is extendable to other film-substrate systems and testing conditions, like non-ambient temperatures.

Crystalline oxides

Plastic deformation

Focused ion beam (FIB)

Scanning electron microscopy (SEM)

Micro-mechanical testing

Författare

Anand Harihara Subramonia Iyer

Chalmers, Fysik, Materialens mikrostruktur

Krystyna Marta Stiller

Chalmers, Fysik, Materialens mikrostruktur

Magnus Hörnqvist Colliander

Chalmers, Fysik, Materialens mikrostruktur

Scripta Materialia

1359-6462 (ISSN)

Vol. 144 9-12

Ämneskategorier

Materialteknik

Annan teknik

Metallurgi och metalliska material

Infrastruktur

Chalmers materialanalyslaboratorium

Styrkeområden

Materialvetenskap

DOI

10.1016/j.scriptamat.2017.09.036

Mer information

Senast uppdaterat

2018-11-07