Analysis of bulk dielectrics with atom probe tomography
Journal article, 2008
[No abstract available]
Author
DJ Larson
Imago Scientific Instruments
R. L. Alvis
Imago Scientific Instruments
D. F. Lawrence
Imago Scientific Instruments
T Prosa
Imago Scientific Instruments
R. M. Ulfig
Imago Scientific Instruments
D Reinhard
Imago Scientific Instruments
P. H. Clifton
Imago Scientific Instruments
Stephan S A Gerstl
Imago Scientific Instruments
J. H. Bunton
Imago Scientific Instruments
D. R. Lenz
Imago Scientific Instruments
T. F. Kelly
Imago Scientific Instruments
Krystyna Marta Stiller
Chalmers, Applied Physics, Microscopy and Microanalysis
Microscopy and Microanalysis
1431-9276 (ISSN) 1435-8115 (eISSN)
Vol. 14 SUPPL. 2 1254-1255Subject Categories
Physical Sciences
DOI
10.1017/S1431927608083657