Analysis of bulk dielectrics with atom probe tomography
Artikel i vetenskaplig tidskrift, 2008

[No abstract available]

Författare

DJ Larson

Imago Scientific Instruments

R. L. Alvis

Imago Scientific Instruments

D. F. Lawrence

Imago Scientific Instruments

T Prosa

Imago Scientific Instruments

R. M. Ulfig

Imago Scientific Instruments

D Reinhard

Imago Scientific Instruments

P. H. Clifton

Imago Scientific Instruments

Stephan S A Gerstl

Imago Scientific Instruments

J. H. Bunton

Imago Scientific Instruments

D. R. Lenz

Imago Scientific Instruments

T. F. Kelly

Imago Scientific Instruments

Krystyna Marta Stiller

Chalmers, Teknisk fysik, Mikroskopi och mikroanalys

Microscopy and Microanalysis

1431-9276 (ISSN) 1435-8115 (eISSN)

Vol. 14 1254-1255

Ämneskategorier

Fysik

DOI

10.1017/S1431927608083657