Multiline TRL Calibration Standards for S-parameter Measurement of Planar Goubau Lines from 0.75 THz to 1.1 THz
Paper in proceedings, 2018

We present a multiline Thru-Reflect-Line (TRL) calibration standard for Planar Goubau Line (PGL) which allows setting the calibration plane along the PGL and thus removing the effect of the embedding structure. This opens the possibility of characterizing PGL-circuits. The presented structures were used for calibrating S-parameters measurements between 0.75 THz and 1.1 THz to characterize a 1 mm long and 10 µm wide PGL. The line shows negligible dispersion with an effective relative permittivity of 2.0 and an attenuation constant lower than 0.35 Np/mm (0.65 dB/λ).

Multiline TRL

S-parameter characterization

Terahertz circuits

Planar Goubau Lines

Calibration

On-wafer THz measurements

Author

Juan Cabello Sánchez

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Helena Rodilla

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Vladimir Drakinskiy

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Jan Stake

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

IEEE MTT-S International Microwave Symposium Digest

0149645X (ISSN)

879-882

2018 IEEE/MTT-S International Microwave Symposium - IMS
Philadelphia, USA,

Areas of Advance

Information and Communication Technology

Infrastructure

Kollberg Laboratory

Nanofabrication Laboratory

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/MWSYM.2018.8439138

More information

Latest update

8/5/2020 2