Multiline TRL Calibration Standards for S-parameter Measurement of Planar Goubau Lines from 0.75 THz to 1.1 THz
Paper in proceeding, 2018
Planar Goubau Lines
S-parameter characterization
Calibration
Multiline TRL
Terahertz circuits
On-wafer THz measurements
Author
Juan Cabello Sánchez
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Helena Rodilla
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Vladimir Drakinskiy
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Jan Stake
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
IEEE MTT-S International Microwave Symposium Digest
0149645X (ISSN)
Vol. 2018-June 879-882 8439138978-1-5386-5068-4 (ISBN)
Philadelphia, USA,
Areas of Advance
Information and Communication Technology
Infrastructure
Kollberg Laboratory
Nanofabrication Laboratory
Subject Categories
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/MWSYM.2018.8439138