Thermal Characterization of Low-Dimensional Materials by Resistance Thermometers
Review article, 2019

The design, fabrication, and use of a hotspot-producing and temperature-sensing resistance thermometer for evaluating the thermal properties of low-dimensional materials are described in this paper. The materials that are characterized include one-dimensional (1D) carbon nanotubes, and two-dimensional (2D) graphene and boron nitride films. The excellent thermal performance of these materials shows great potential for cooling electronic devices and systems such as in three-dimensional (3D) integrated chip-stacks, power amplifiers, and light-emitting diodes. The thermometers are designed to be serpentine-shaped platinum resistors serving both as hotspots and temperature sensors. By using these thermometers, the thermal performance of the abovementioned emerging low-dimensional materials was evaluated with high accuracy.

carbon nanotube

resistance temperature detector

thermal characterization

graphene

boron nitride

heat spreader

Author

Yifeng Fu

Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems Laboratory

G Cui

Sun Yat-Sen University

Kjell Jeppson

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Materials

1996-1944 (ISSN)

Vol. 12 11 1740

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Areas of Advance

Nanoscience and Nanotechnology (2010-2017)

Production

Subject Categories

Nano Technology

Infrastructure

Nanofabrication Laboratory

DOI

10.3390/ma12111740

More information

Latest update

10/14/2019