Atomic-scale characterization of diffusion kinetics in Ru/Al multilayer thin films
Journal article, 2019
Thin film
Atom probe
Grain boundary
Author
Hisham Aboulfadl
Chalmers, Physics, Microstructure Physics
Universität des Saarlandes
Frank Mücklich
Universität des Saarlandes
Materials Letters
0167-577X (ISSN) 18734979 (eISSN)
Vol. 254 344-347Subject Categories
Inorganic Chemistry
Materials Chemistry
Metallurgy and Metallic Materials
DOI
10.1016/j.matlet.2019.07.102