Hisham Aboulfadl

Researcher at Microstructure Physics

My current research focus is on the material characerization of thin film solar cells, mainly using the atom probe tomography technique. The project is part of an SSF Project in collaboration with Uppsala University.

Source: chalmers.se
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Showing 5 publications

2020

Revealing the interface nature of ZDDP tribofilm by X-ray photoelectron spectroscopy and atom probe tomography

Chia-Jui Hsu, Jenifer Barrirero, Rolf Merz et al
Industrial Lubrication and Tribology. Vol. In Press
Journal article
2020

Dynamic Impurity Redistributions in Kesterite Absorbers

Sigbjørn Grini, Hisham Aboulfadl, Nils Ross et al
Physica Status Solidi (B): Basic Research. Vol. 257 (6)
Journal article
2019

Atomic-scale characterization of diffusion kinetics in Ru/Al multilayer thin films

Hisham Aboulfadl, Frank Mücklich
Materials Letters. Vol. 254, p. 344-347
Journal article
2019

Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography

Hisham Aboulfadl, Fabian Seifried, Michael Stüber et al
Materials Letters. Vol. 236, p. 92-95
Journal article

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