Contactless Measurement of a D-Band On-Chip Antenna Using an Integrated Reflective Load Switch
Journal article, 2024

A novel measurement setup is proposed for the contactless characterization of on-chip antennas. A D-band patch antenna is fabricated on a 100 μm-thick GaAs substrate and is monolithically integrated with a reflective load switch to allow for fast electronic control of the antenna port termination. The antenna under test is illuminated by a reference antenna in the anechoic chamber after which the impedance and gain of the patch antenna are reconstructed from the change in backscattered field due to different port terminations. In our experiment, the over-the-air reconstructed antenna input impedance exhibits a frequency shift of less than 1% with respect to the (non-ideal) on-wafer probe measurement in the 115–130 GHz frequency range. Furthermore, the measured realized gain of 0.9±0.5 dBi is close to the simulated one of 1.1 dBi.

Antenna measurements

Loaded antennas

Semiconductor device measuremen

Antennas

Switches

Author

Dmitrii Kruglov

Chalmers, Electrical Engineering, Communication, Antennas and Optical Networks

Pavlo Krasov

Chalmers, Electrical Engineering, Communication, Antennas and Optical Networks

Oleg Iupikov

Chalmers, Electrical Engineering, Communication, Antennas and Optical Networks

Artem Vilenskiy

Chalmers, Electrical Engineering, Communication, Antennas and Optical Networks

Marianna Ivashina

Chalmers, Electrical Engineering, Communication, Antennas and Optical Networks

Rob Maaskant

Chalmers, Electrical Engineering, Communication, Antennas and Optical Networks

IEEE Antennas and Wireless Propagation Letters

1536-1225 (ISSN) 15485757 (eISSN)

Vol. 23 3 1075-1079

EUREKA EURIPIDES2 InnoStar - Innovative Systems and Automated Design for 5G/6G Connectivity and Radar Applications

VINNOVA (2021-04055), 2021-12-01 -- 2025-03-31.

Subject Categories

Telecommunications

Communication Systems

Other Electrical Engineering, Electronic Engineering, Information Engineering

Condensed Matter Physics

DOI

10.1109/LAWP.2023.3344542

More information

Latest update

3/21/2024