Characterization and Modeling of Dynamic Thermal Coupling in GaN MMIC Power Amplifiers
Paper in proceeding, 2024

The dynamic thermal coupling in integrated GaN power amplifiers is studied based on transient measurements on an amplifier structure with integrated temperature sensors. The results show that the thermal coupling from a transistor can modulate neighboring transistors with a low pass filtered response. Here, the cut-off frequency and amplitude of the modulation effect are reduced with separation while the phase shift increases. When applied to a large power amplifier, it is shown that the temperature gradient over the amplifier will vary dynamically, where five distinct time regions are identified. A numerical model is presented to validate the measurements. The results can be used to improve the accuracy of electro-thermal models of GaN power amplifiers.

power amplifiers

gallium nitride

thermal sensors

thermal coupling

electro-thermal device modeling

Author

Tobias Kristensen

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Torbjörn M.J. Nilsson

Saab

Andreas Divinyi

Saab

Johan Bremer

Mattias Thorsell

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Saab

IEEE MTT-S International Microwave Symposium Digest

0149645X (ISSN)

1053-1056
9798350375046 (ISBN)

2024 IEEE/MTT-S International Microwave Symposium, IMS 2024
Washington, USA,

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/MS40175.2024.10600290

More information

Latest update

10/2/2024