Analysis of bone minerals by time-of-flight secondary ion mass spectrometry: a comparative study using monoatomic and cluster ions sources.
Journal article, 2007
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an important tool for the analysis of bone minerals at implant surfaces. Most studies have been performed with monoatomic primary ion sources such as Ga(+) with poor secondary molecular ion production efficiency and only elemental distributions and minor fragments of bone minerals have been reported. By using cluster ion sources, such as Au(1-3) (+) and Bi(1-3) (+), identification of larger hydroxyapatite species at m/z 485, 541, 597 and 653, identified as Ca(5)P(3)O(12), Ca(6)P(3)O(13), Ca(7)P(3)O(14) and Ca(8)P(3)O(15), respectively, became possible. The ions appear to be fragments of the hydroxyapatite unit cell Ca(10)(PO(4))(6)(OH)(2). Each ion in the series is separated by 55.9 m/z units, corresponding to CaO, and this separation might reflect the columnar nature of the unit cell.
Animals
methods
Durapatite
Mass
chemistry
chemistry
Spectrometry
Mass
Humans
Secondary Ion
Electrospray Ionization
chemistry
Cricetinae
methods
Dental Enamel
analysis
Ions
Bone and Bones
Spectrometry
Author
Per Malmberg
University of Gothenburg
Ulf Bexell
Cecilia Eriksson
University of Gothenburg
Håkan Nygren
University of Gothenburg
Katrin Börner
University of Gothenburg
Rapid Communications in Mass Spectrometry
0951-4198 (ISSN) 1097-0231 (eISSN)
Vol. 21 5 745-9Subject Categories
MEDICAL AND HEALTH SCIENCES
DOI
10.1002/rcm.2890
PubMed
17279603