Analysis of bone minerals by time-of-flight secondary ion mass spectrometry: a comparative study using monoatomic and cluster ions sources.
Artikel i vetenskaplig tidskrift, 2007

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an important tool for the analysis of bone minerals at implant surfaces. Most studies have been performed with monoatomic primary ion sources such as Ga(+) with poor secondary molecular ion production efficiency and only elemental distributions and minor fragments of bone minerals have been reported. By using cluster ion sources, such as Au(1-3) (+) and Bi(1-3) (+), identification of larger hydroxyapatite species at m/z 485, 541, 597 and 653, identified as Ca(5)P(3)O(12), Ca(6)P(3)O(13), Ca(7)P(3)O(14) and Ca(8)P(3)O(15), respectively, became possible. The ions appear to be fragments of the hydroxyapatite unit cell Ca(10)(PO(4))(6)(OH)(2). Each ion in the series is separated by 55.9 m/z units, corresponding to CaO, and this separation might reflect the columnar nature of the unit cell.

Animals

methods

Durapatite

Mass

chemistry

chemistry

Spectrometry

Mass

Humans

Secondary Ion

Electrospray Ionization

chemistry

Cricetinae

methods

Dental Enamel

analysis

Ions

Bone and Bones

Spectrometry

Författare

Per Malmberg

Göteborgs universitet

Ulf Bexell

Cecilia Eriksson

Göteborgs universitet

Håkan Nygren

Göteborgs universitet

Katrin Börner

Göteborgs universitet

Rapid Communications in Mass Spectrometry

0951-4198 (ISSN) 1097-0231 (eISSN)

Vol. 21 745-9

Ämneskategorier

MEDICIN OCH HÄLSOVETENSKAP

DOI

10.1002/rcm.2890

PubMed

17279603