Characterization and dielectric properties of beta-SiC nanofibres
Journal article, 2008
TEM
SiC nanofibres
SEM
dielectric properties
EELS
Author
Yiming Yao
Chalmers, Materials and Manufacturing Technology, Materials Technology
Anna Jänis
Swedish Defence Research Agency (FOI)
Uta Klement
Chalmers, Materials and Manufacturing Technology, Surface and Microstructure Engineering
Journal of Materials Science
0022-2461 (ISSN) 1573-4803 (eISSN)
Vol. 43 3 1094-1101Areas of Advance
Nanoscience and Nanotechnology
Materials Science
Subject Categories
Materials Engineering
DOI
10.1007/s10853-007-2249-7