A General Weibull Model For Reliability Analysis Under Different Failure Criteria –Application on Anisotropic conductive adhesive joining technology
Paper in proceedings, 2004

Author

Johan Liu

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Liqiang Cao

Min Xie

Thong-Ngee Goh

Yong Tang

Proceedings of the Polytronik04

RT23-

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/6/2017