Randomized benchmarking and process tomography for gate errors in a solid-state qubit
Journal article, 2009
Author
J.M. Chow
J.M. Gambetta
Lars Tornberg
Chalmers, Microtechnology and Nanoscience (MC2), Applied Quantum Physics
Jens Koch
Lev S. Bishop
A. A. Houck
B. R. Johnson
L. Frunzio
S.M. Girvin
RJ Schoelkopf
Physical Review Letters
0031-9007 (ISSN) 1079-7114 (eISSN)
Vol. 102 9Subject Categories
Condensed Matter Physics
DOI
10.1103/PhysRevLett.102.090502