Characterization Setup for Device Level Dynamic Load Modulation Measurements
Paper in proceedings, 2009

A dynamic load modulation characterization method is presented. The method gives insight into the device operation under dynamic load modulation conditions. The presented method is based on an active injection load-pull system. The load impedance is dynamically controlled to follow an optimum trajectory, resulting in higher efficiency in back-off operation. On-wafer measurements at 2.14 GHz using a LDMOS device are used to demonstrate the method. The measured results show excellent agreement between static characterization and dynamic measurements.

Load-pull

Load modulation

LDMOS

Author

Mattias Thorsell

GigaHertz Centre

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Kristoffer Andersson

GigaHertz Centre

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Christian Fager

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

GigaHertz Centre

International Microwave Symposium Digest, 2009, Boston

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017