An On-Wafer Method for C-V Characterisation of Heterostructure Diodes
Journal article, 1995

Author

Jan Stake

Department of Microwave Technology

Hans Grönqvist

Department of Microwave Technology

Microwave Opt. Technol. Lett.

Vol. 9 2 63-66

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017