Analysis of interfaces in WC-Co with cubic carbide additions
Conference contribution, 2009

APFIM

laser assisted atom probe

EDX

TEM

Author

Jonathan Weidow

Chalmers, Applied Physics, Microscopy and Microanalysis

Hans-Olof Andrén

Chalmers, Applied Physics, Microscopy and Microanalysis

Bo Jansson

Jenni Zackrisson

Susanne Norgren

17th Plansee Seminar, Eds. LS Sigl, P Rödhammer and H Wildner, Plansee Group, Reutte, Austria

Vol. 2 HM3/1-8

Subject Categories

Manufacturing, Surface and Joining Technology

More information

Created

10/7/2017