Analysis of interfaces in WC-Co with cubic carbide additions
Other conference contribution, 2009
APFIM
laser assisted atom probe
EDX
TEM
Author
Jonathan Weidow
Chalmers, Applied Physics, Microscopy and Microanalysis
Hans-Olof Andrén
Chalmers, Applied Physics, Microscopy and Microanalysis
Bo Jansson
Jenni Zackrisson
Susanne Norgren
17th Plansee Seminar, Eds. LS Sigl, P Rödhammer and H Wildner, Plansee Group, Reutte, Austria
Vol. 2 HM3/1-8
Subject Categories
Manufacturing, Surface and Joining Technology