Multiparameter admittance spectroscopy for metal-oxide-semiconductor systems
Journal article, 2009
interface states
MIS structures
surface potential
electric admittance measurement
Author
Johan Piscator
Chalmers, Applied Physics, Physical Electronics
Bahman Raeissi
Chalmers, Applied Physics, Physical Electronics
Olof Engström
Chalmers, Applied Physics, Physical Electronics
Journal of Applied Physics
0021-8979 (ISSN) 1089-7550 (eISSN)
Vol. 106 5 054510- 054510Subject Categories
Other Engineering and Technologies
Other Engineering and Technologies not elsewhere specified
DOI
10.1063/1.3213384