Microwave characterization of Ti/Au-graphene contacts
Journal article, 2013

In this paper, we report on a microwave characterization of the interface between Ti/Au contacts and chemical vapor deposition graphene using structures of Corbino geometry, with primary focus on extracting and modeling the capacitance associated with the contact region. It is found that with the current contact resistivity, ρc∼10^−6 Ωcm2, the contact capacitance, on the order Cc∼1 μF/cm2, has a negligible effect on microwave transmission through the contact below ∼100 GHz. Finally, a parallel plate capacitance model for the contact is presented.

Graphene

contact capacitance

contact resistance

microwave characterization

Author

MICHAEL ANDERSSON

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Andrei Vorobiev

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Jie Sun

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Avgust Yurgens

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Spartak Gevorgian

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Jan Stake

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Applied Physics Letters

0003-6951 (ISSN) 1077-3118 (eISSN)

Vol. 103 17 173111- 173111

Areas of Advance

Information and Communication Technology

Nanoscience and Nanotechnology (2010-2017)

Infrastructure

Nanofabrication Laboratory

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1063/1.4826645

More information

Created

10/7/2017