The deformation Characterization of Conductive Particles in Anisotropically Conductive Adhesive Using FEM
Paper in proceeding, 2004
Author
Liqiang Cao
Yanli Wang
Guoliang Chen
Johan Liu
Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics
Proceedings of the IMAPS Nordic Annual Conference
Vol. September 21-23 pp 92-97
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering