Transmission electron microscopy and X-ray diffraction analysis of alumina coating by alternate-current inverted magnetron-sputtering technique

Aditya Aryasomayajula; Sead Canovic; Deepak Bhat; Matt Gordon; Mats Halvarsson

Transmission electron microscopy and X-ray diffraction analysis of alumina coating by alternate-current inverted magnetron-sputtering technique
Journal article, 2007

Author

Aditya Aryasomayajula

Sead Canovic

Chalmers, Applied Physics, Microscopy and Microanalysis

Other publications Research

Deepak Bhat

Matt Gordon

Mats Halvarsson

Chalmers, Applied Physics, Microscopy and Microanalysis

Other publications Research

Thin Solid Films

Vol. 516 397-401

Subject Categories

Other Engineering and Technologies not elsewhere specified

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Created

10/6/2017

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