Extraction of emitter and base series resistances of bipolar transistors from a single DC measurement
Journal article, 2000
Author
Martin Linder
Fredrik Ingvarson
Department of Microelectronics
Kjell Jeppson
Department of Microelectronics
Jan Grahn
Shi-Li Zhang
Mikael Östling
IEEE Transactions on Semiconductor Manufacturing
Vol. 13 2 119-126
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering