A procedure for characterizing the BJT base resistance and Early voltages utilizing a dual base transistor test structure
Paper in proceeding, 2001
Author
Fredrik Ingvarson
Department of Microelectronics and Nanoscience
Martin Linder
Kjell Jeppson
Department of Microelectronics and Nanoscience
Shi-Li Zhang
Jan Grahn
Mikael Östling
Proceedings of the 2001 IEEE International Conference on Microelectronic Test Structures
31-36
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering