Capturing Process-Voltage-Temperature (PVT) Variations in Architectural Static Power Modeling for SRAM Arrays

Report, 2007

We propose a modeling methodology, including power models, that captures the dependence of leakage power on temperature and supply voltage variations for accurate architectural-level power estimation of physically partitioned and un-partitioned SRAMarrays. A simulation -based modeling approach is used for temperature-aware leakage power estimation, while a physically-based analytical approach is used for modeling the leakage dependence of memory cells on supply voltage. By using the new power models, it is, for example, possible to preserve our previously reported power estimation accuracy of 96% also in the presence of temperature and voltage variations.