Reynolds Stress Measurements using Direction-Sensitive Double-Chip Silicon Sensors
Artikel i vetenskaplig tidskrift, 1991

A small direction-sensitive double-chip silicon-based sensor has been designed and fabricated using microelectronic technology. To determine the performance of this sensor the Reynolds stresses in a two-dimensional flat plate boundary layer were determined at a Reynolds number of 4.2*106. Comparisons with conventional hot-wire sensors were made showing that the double-chip sensor was able to determine the turbulent stresses to the same accuracy as a cross hot wire.


Lennart Löfdahl

Chalmers, Institutionen för termo- och fluiddynamik

Göran Stemme

Institutionen för tillämpad elektronik

Bert Johansson

Chalmers, Institutionen för termo- och fluiddynamik

Measurements Science and Technology

Vol. 2 369-373


Strömningsmekanik och akustik

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