A new time-of-flight SIMS instrument for 3D imaging and analysis
Paper i proceeding, 2011
Författare
Rowland Hill
Paul Blenkinsopp
Stephen Thompson
John Vickerman
John Fletcher
Surface and Interface Analysis
Vol. 43 1-2 506-509
Ämneskategorier
Analytisk kemi
DOI
10.1002/sia.3562