Atom probe tomography of oxide scales
Artikel i vetenskaplig tidskrift, 2013

Atom probe tomography, APT, is the only microstructural method that can routinely analyse and position individual atoms in a material with a spatial resolution of 0.1-0.5 nm. Recent implementation of pulsed-laser to APT made investigation of less conducting materials, such as oxides, feasible. In this paper a short description of the principle of the techniques is presented, followed by examples of recent APT studies of thermally grown oxide scales produced on alumina formers (Pt-modified NiAl diffusion coating and FeCrAl alloy), at the crack tips in a Ni-based alloy and on a Zr-alloy. Additionally, results from preliminary studies of ZnO and MgO bulk materials are shown. The obtained information on the atomic scale about the chemistry variations in the scales and at the metal oxide interfaces provides valuable insights into oxidation processes. © 2012 Springer Science+Business Media New York.

atomic scale

atom probe tomography

oxides

microstructure

Författare

Krystyna Marta Stiller

Chalmers, Teknisk fysik, Materialens mikrostruktur

Leif Viskari

Chalmers, Teknisk fysik, Materialens mikrostruktur

Gustav Sundell

Chalmers, Teknisk fysik, Materialens mikrostruktur

Fang Liu

Chalmers, Teknisk fysik, Materialens mikrostruktur

Mattias Thuvander

Chalmers, Teknisk fysik, Materialens mikrostruktur

Hans-Olof Andrén

Chalmers, Teknisk fysik, Materialens mikrostruktur

DJ Larson

Cameca Instruments Inc.

T Prosa

Cameca Instruments Inc.

D Reinhard

Cameca Instruments Inc.

Oxidation of Metals

0030-770X (ISSN) 1573-4889 (eISSN)

Vol. 79 3-4 227-238

Styrkeområden

Materialvetenskap

Ämneskategorier

Korrosionsteknik

DOI

10.1007/s11085-012-9330-6