A novel depleted semi-insulating silicon material for high frequency applications
Paper i proceeding, 2002
wafer bonding
semiconductor thin films
bonds (chemical)
surface conductivity
interface structure
elemental semiconductors
space charge
semiconductor process modelling
quartz
SIMOX
electrical resistivity
silicon
Författare
Mikael Johansson
Institutionen för mikroelektronik
Stefan Bengtsson
Institutionen för mikroelektronik
Progress in SOI Structures and Devices Operating at Extreme Conditions. Proceedings of the NATO Advanced Research Workshop
333-
Ämneskategorier
Annan elektroteknik och elektronik