Peptide structural analysis using continuous Ar cluster and C60 ion beams
Artikel i vetenskaplig tidskrift, 2013

A novel application of time-of-flight secondary ion mass spectrometry (ToF-SIMS) with continuous Ar cluster beams to peptide analysis was investigated. In order to evaluate peptide structures, it is necessary to detect fragment ions related to multiple neighbouring amino acid residues. It is, however, difficult to detect these using conventional ToF-SIMS primary ion beams such as Bi cluster beams. Recently, C60 and Ar cluster ion beams have been introduced to ToF-SIMS as primary ion beams and are expected to generate larger secondary ions than conventional ones. In this study, two sets of model peptides have been studied: (des-Tyr)-Leuenkephalin and (des-Tyr)-Met-enkephalin (molecular weights are approximately 400 Da), and [Asn1 Val5]-angiotensin II and [Val5]-angiotensin I (molecular weights are approximately 1,000 Da) in order to evaluate the usefulness of the large cluster ion beams for peptide structural analysis. As a result, by using the Ar cluster beams, peptide molecular ions and large fragment ions, which are not easily detected using conventional ToF-SIMS primary ion beams such as Bi3+, are clearly detected. Since the large fragment ions indicating amino acid sequences of the peptides are detected by the large cluster beams, it is suggested that the Ar cluster and C60 ion beams are useful for peptide structural analysis.

Continuous Ar cluster beam . ToF-SIMS . Peptide structure . (des-Tyr)-enkephalin . Angiotensin


Satoka Aoyagi

John Fletcher

Göteborgs universitet

Sadia Sheraz

Tomoko Kawashima

Irma Berrueta Razo

Alex Henderson

Nicholas P Lockyer

John C Vickerman

Analytical and Bioanalytical Chemistry

1618-2642 (ISSN) 1618-2650 (eISSN)

Vol. 405 6621-6628


Analytisk kemi