Sample preparation and microstructural characterization of the gamma titanium aluminide Ti-48Al-2W-0.5Si
Artikel i vetenskaplig tidskrift, 1997

Preparing samples that faithfully reveal all microstructural features in γ-TiAl-base alloys for both optical and scanning electron microscope studies is fraught with difficulties. This study demonstrates that satisfactory results can be obtained through mechanical grinding, polishing, and proper etching. A preparation recipe is presented. Nine lots of investmentcast γ-TiAl material with the nominal composition of Ti-48Al-2W-0.5Si have been characterized through optical and scanning electron microscope examinations. The study shows that a small depletion in Al content has a large effect on the microstructure. The duplex microstructure with a lamellar Full-size image (<1 K) colony size of about 500μm and a large percentage of singlephase γ grains as large as 200μm is altered to a coarse, nearly lamellar microstructure with a colony size as large as 5000μm and a small percentage of small single-phase γ grains in the colony boundaries.

Författare

Viktor Recina

Institutionen för metalliska konstruktionsmaterial

Johan Ahlström

Institutionen för metalliska konstruktionsmaterial

Birger Karlsson

Institutionen för metalliska konstruktionsmaterial

Materials Characterization

1044-5803 (ISSN)

Vol. 38 287-300

Styrkeområden

Transport

Materialvetenskap

Fundament

Grundläggande vetenskaper

Ämneskategorier

Annan materialteknik

Metallurgi och metalliska material

DOI

10.1016/S1044-5803(97)00033-8