Bi-induced acceptor level responsible for partial compensation of native free electron density in InP1-xBix dilute bismide alloys
Artikel i vetenskaplig tidskrift, 2016

Deep level transient spectroscopy (DLTS) has been applied to study electron and hole traps in InPBi alloys with 2.2 and 2.4% Bi grown by molecular beam epitaxy. One donor-like trap with the activation energy of 0.45-0.47 eV and one acceptor-like trap with activation energy of 0.08 eV have been identified in DLTS measurements. For the reference sample (InP grown at the same temperature), the deep donor trap has also been observed, while the acceptor trap was not detected. According to the literature, the deep donor level found in InP(Bi) at 0.45-0.47 eV below the conduction band has been attributed to the isolated P-In defect, while the second trap, which is observed only for Bi containing samples at 0.08 eV above the valence band can be attributed to Bi clusters in InPBi. This acceptor level was proposed to be responsible for the observed partial compensation of native free electron density in InPBi layers. It is also shown that the deep donor traps are active in photoluminescence (PL). A strong radiative recombination between donor traps and the valence band are observed in PL spectra at energy 0.6-0.8 eV, i.e. similar to 0.47 eV below the energy gap of InPBi, which is determined by contactless electroreflectance.



deep-level defects




L. Gelczuk

Politechnika Wrocławska

H. Stokowski

Politechnika Wrocławska

J. Kopaczek

Politechnika Wrocławska

L. Y. Zhang

Chinese Academy of Sciences

Y. Li

Chinese Academy of Sciences

K. Wang

Chinese Academy of Sciences

P. Wang

Chinese Academy of Sciences

Shu Min Wang

Chalmers, Mikroteknologi och nanovetenskap, Fotonik

R Kudrawiec

Politechnika Wrocławska

Journal of Physics D: Applied Physics

0022-3727 (ISSN)

Vol. 49 11 115107





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