Local electric field screening in bi-layer graphene devices
Artikel i vetenskaplig tidskrift, 2014
Electrical gating
Scanning gate microscopy
Single-layer graphene
Epitaxial graphene
Double-layer graphene
Författare
V. Panchal
National Physical Laboratory (NPL)
Royal Holloway University of London
C. E. Giusca
National Physical Laboratory (NPL)
Arseniy Lartsev
Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik
R. Yakimova
Linköpings universitet
O. Kazakova
National Physical Laboratory (NPL)
Frontiers of Physics
2296424x (eISSN)
Vol. 2 1-10Ämneskategorier
Materialteknik
DOI
10.3389/fphy.2014.00003